- Joined
- Apr 28, 2010
- Posts
- 1,075
I'm trying to test 17 winbond 24258 chips (w24258s-70LE as used on mvs, also toshiba TC55257DFL-85L).
For that purpose, it is supposed I can use my eprom programmer (wellon vp280 with the last firmware/software updates) with a sop28 to dip28 adapter. I know is a small programmer, but in the specifications and software appears that chip as supported for testing.
The problem comes when I test it and every single chip says:
"Device Address:00004000H Device Data:FFH Buffer Address:00004000H Buffer Data:74H
>>Test fail!
>> 2,84Sec"
Always on the 4000H address (the buffer data changes from chip to chip). These chips are supposed to have 8000H, so it is weird it stops at the half capacity.
Any idea on how to test that chips or what could be wrong?
I was even thinking on soldering one by one in a mvs working board as "work ram" and make the workramtest, but the pcb could suffer soldering and desoldering 17 times on the same place.
For that purpose, it is supposed I can use my eprom programmer (wellon vp280 with the last firmware/software updates) with a sop28 to dip28 adapter. I know is a small programmer, but in the specifications and software appears that chip as supported for testing.
The problem comes when I test it and every single chip says:
"Device Address:00004000H Device Data:FFH Buffer Address:00004000H Buffer Data:74H
>>Test fail!
>> 2,84Sec"
Always on the 4000H address (the buffer data changes from chip to chip). These chips are supposed to have 8000H, so it is weird it stops at the half capacity.
Any idea on how to test that chips or what could be wrong?
I was even thinking on soldering one by one in a mvs working board as "work ram" and make the workramtest, but the pcb could suffer soldering and desoldering 17 times on the same place.
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